JPS59194080U - 半導体装置の特性測定装置 - Google Patents

半導体装置の特性測定装置

Info

Publication number
JPS59194080U
JPS59194080U JP8831783U JP8831783U JPS59194080U JP S59194080 U JPS59194080 U JP S59194080U JP 8831783 U JP8831783 U JP 8831783U JP 8831783 U JP8831783 U JP 8831783U JP S59194080 U JPS59194080 U JP S59194080U
Authority
JP
Japan
Prior art keywords
semiconductor device
characteristic measuring
measuring device
support block
measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP8831783U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0114940Y2 (en]
Inventor
寛之 山口
Original Assignee
日本電気ホームエレクトロニクス株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日本電気ホームエレクトロニクス株式会社 filed Critical 日本電気ホームエレクトロニクス株式会社
Priority to JP8831783U priority Critical patent/JPS59194080U/ja
Publication of JPS59194080U publication Critical patent/JPS59194080U/ja
Application granted granted Critical
Publication of JPH0114940Y2 publication Critical patent/JPH0114940Y2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP8831783U 1983-06-08 1983-06-08 半導体装置の特性測定装置 Granted JPS59194080U (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8831783U JPS59194080U (ja) 1983-06-08 1983-06-08 半導体装置の特性測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8831783U JPS59194080U (ja) 1983-06-08 1983-06-08 半導体装置の特性測定装置

Publications (2)

Publication Number Publication Date
JPS59194080U true JPS59194080U (ja) 1984-12-24
JPH0114940Y2 JPH0114940Y2 (en]) 1989-05-02

Family

ID=30218229

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8831783U Granted JPS59194080U (ja) 1983-06-08 1983-06-08 半導体装置の特性測定装置

Country Status (1)

Country Link
JP (1) JPS59194080U (en])

Also Published As

Publication number Publication date
JPH0114940Y2 (en]) 1989-05-02

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